Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.  

  • We provide general purpose EDS, WDS and EBSD tools that are used to characterise materials at the micro- and nanoscale
  • We provide application-specific solutions such as Gunshot Residue Analysis, Mineral Liberation, ThinFilm analysis and more.
  • Through our Omniprobe products, we have the ability to physically manipulate samples inside the microscope to prepare TEM or atom probe samples, study nanowires, and build nanoassemblies.
  • With our integrated solutions we can layer films at the atomic level and measure their thickness, perform fault isolation, failure analysis and the measurement of mechanical and electrical properties – all at the nanoscale.

Our innovative technology delivers faster, more accurate analysis for both research and industrial applications